| DC Dielectric Tests (DCW, DCIR, DCez) |
| DC Output Voltage |
20V to 6500V (951i & 952i)
50V to 11000V (953i, 954i & 955i)
100V to 15000V (957i)
DC Dielectric Tests (DCW, DCIR, DCez) : Accuracy: 0.25% + 0.5V (1 year 23°C ± 3°) |
| DC Current Sourcing |
50mA max, 25mA above 6000V (951i & 952i)
30mA max, 20mA above 6000V, 10mA above 7500V,
5mA above 9000V (953i, 954i, 955i) 10mA (957i) |
| Ramp Time |
0.01 to 9999sec, 0.01sec resolution or 0.1 to 50000V/sec, 0.1V/sec resolution |
| Dwell Time |
0.02 to 9999 seconds or user terminated, 0.01sec resolution |
| DC Leakage Current |
Measurement Range: 0 to +/-200mA,
Resolution: 4 digits (9999 counts) down to 100pico-amps
Accuracy: 0.25% + 0.5nA + ½ digit (1 year 23°C ± 3°)
Selectable Min & Max limits for Ramp & Dwell, from 100 pico-amps up
Measurement Period: 1 power line cycle (50/60Hz) |
| Insulation Resistance (IR) |
Test modes include: End on pass reading, end on fail or end on timer |
| Low Resistance Measurement |
| Measurement Range |
0 to 150Kohm (999.9mΩ to 99.99KΩ, 149.9KΩ in 7 ranges). |
| Resolution |
4 digits, 100µΩ on 1ohm range |
| Test Current |
55mAdc constant current up to ≈ 91Ω, 5VDC constant V above |
| Accuracy (4-wire) |
0.5% + 0.002ohm + ½ digit up to 30K ohm
1.5% + ½ digit above 30K ohm
5% + 1 digit from 100K to 150K ohm
Add 20mΩ for 2 -wire |
| AC Dielectric Tests (ACW, ACez, ACCAP) |
| AC Output Voltage |
20V to 6000V RMS (951i, 952i, 953i, 954i)
50V to 10,000V RMS (955i)
Resolution: 0.1V up to 999.9V, 1V above
Accuracy: 0.25% + 1.5V (+ 0.01% per Hz above 100Hz)
Decrease max output voltage by 0.1% per Hz above 100Hz
Decrease max voltage by 12.5V/mA loading (25V/ma 955i) |
| AC Current Sourcing |
50mA RMS max (951i, 952i, 953i, 954i)
30mA RMS max (955i)
100mA RMS max with 500VA option (951i, 953i)
200mA RMS with option AC-2 (2KVAC RMS max output) |
| Output Frequency |
Digitally synthesized, low distortion sinewave
20Hz to 500Hz, standard, 500VA or AC-2)
40Hz to 500Hz, (955i)
0.1% accuracy, 0.1Hz resolution (1Hz above 99.9Hz) |
| Ramp Time |
0 to 9999sec, 0.01sec resolution or 0.1 to 100000V/sec, 0.1V/sec resolution |
| Dwell Time |
0.02 to 9999 seconds or user terminated, 0.01sec resolution |
| AC Leakage Current |
Measurement Range: 0 to +/-200mA RMS
Resolution: 4 digits (9999 counts) down to 100pico-amps
Accuracy: 0.5% + 10nA (add 0.005% per Hz above 100Hz)
Selectable min & max limits for Ramp & Dwell, from 100 pico-amps up
Measurement Period: 1 power line cycle (50/60Hz) |
| Phase Measurement |
Total RMS current, In-phase current, Quadrature current (reactive/out-of-phase)
Accuracy: 0.01° per Hz, relative to output voltage |
| Line Leakage Current & Voltage Measurement (Models 951i - 955i only) |
| Voltage Measurement |
0 to ± 8KVDC 6KV RMS AC (951i & 952i)
0 to ± 11KVDC 8KV RMS AC (953i & 954i)
0 to ± 11KVDC 10KV RMS AC ( 955i)
Resolution: 0.1V, 1 V above 999.9V
DC Accuracy: 0.25% + 0.5V AC Accuracy: 0.5% + 1.5V |
| Leakage Current |
0 to ± 200mA DC or RMS AC
Resolution: 4 digits (9999 counts) down to 100pico-amps
DC Accuracy: 0.25% + 0.5nA AC Accuracy: 0.5% + 20nA |
| Test Results |
Test Time: 0.02 to 9999 sec
Last, Minimum, Average & Max V& A reading plus arc current |
| Pulse Mode (Flash) Test (Option PMT-1 available on models 951i, 952i, 953i, 954i) |
| Test Waveform |
Trapezoidal (Selectable positive polarity, negative polarity or bi-polar) |
| Ramp Up/Down Time |
1ms (0.5ms for option AC2) to 30mS with 0.1ms resolution |
| Dwell Time |
1ms (0.5ms for option AC2) to 30mS with 0.1ms resolution |
| Test Voltage |
50V to 8000V (20V to 2750V with option AC-2) |
| Resolution |
0.1V up to 999.9V, 1V above |
| Accuracy |
0.25% + 1.5V |
| General Specifications |
| Arc Detection |
Test Specific, Dual Parameter. Allows a specific broadband current amplitude limit from 2 to 20mA peak and pulse width limit from 4 to 30 microseconds for each test |
| Ethernet |
High speed, high noise immunity LAN interface |
| RS232 Interface |
Selectable baud: 9600, 19200, 38400, 57600 or 115200, full handshake |
| VICL Interfaces |
Two each provided for control of HV Scanners and other 950i series units |
| Digital I/O Interface |
Provides 8 digital inputs and 5 digital outputs. Functions include Test Selection, Start/Stop, Testing, Pass/Fail, Print, HV Present, Safety Interrupt, Dwell Timer |
| USB Host Printer Port |
For hard copy test reports and LAN/Ethernet Interface |
| Optional GPIB |
Option GP-9 adds GPIB capability to LAN/Ethernet card |
| Test Lead Safety Sense |
TLSS™ Technology continuously verifies that test leads are properly connected prior to and during HV, 4-wire Low Ohms and Ground Bond testing |
| Real Time Clock |
Accuracy: 10 seconds per day, Battery Backup: 30 days minimum |
| Non-Volatile Memory |
100 user test sequences up to 100 steps each not to exceed 1000 total test steps. All test sequences, user settings and calibration data are stored in internal non-volatile Memory data retention is specified for 20 years and 1000000 write cycles |
| Dwell Time Accuracy |
0.05% + 20mS, Digital output provides dwell timer verification |
| Operating Temperature |
0 °C to 50 °C |
| Humidity |
90% RH max, 0 to 40 C |
| Power |
110 to 260 VAC, 50-60 Hz, 500VA Max |
| Dimensions |
89mm H x 432mm W x 457mm D (3.5" H x 17" W x 18" D) |
| Weight |
9Kg (18 lb.) Net / 18Kg (25 lb.) shipping (951i, 953i, 959i)
14Kg (28 lb.) Net / 18Kg (35 lb.) shipping (952, 954i, 955i) |
| Accessories |
Alligator test leads, NIST traceable calibration certificate with no data, power cord and operator's manual. ISO 17025 cal cert with data and uncertainties available |
| Warranty |
One year parts and labor standard, 3 year extended warranty with registration and annual factory calibration |