Single Input DC Load (350W/60A/150V)
The EL30000 Series bench DC electronic loads provide superior performance in compact bench form factor. A single and dual-channel model is available with up to 600W - ideal for design verification of consumer power supplies, batteries, battery modules, solar panels, LED drivers, and power converters. You can easily characterize wide-bandgap semiconductor components such as MOSFET and IGBT.
The EL30000 Series bench DC electronic loads are fully SCPI programmable with built-in USB, LAN, and optional GPIB interfaces. Advance features include scope view, data logging, sequencing, and more, enabling you to measure, capture and quickly display your results.
Measure voltage and current accurately
Each EL30000 Series bench DC electronic loads have a fully integrated voltmeter and ammeter to simultaneously measure the voltage and current for the device under test (DUT). Eliminating external shunt resistors and cables gives you accurate voltage, current, and energy measurements.
To further reduce cabling error, the EL30000 Series bench DC electronic loads have remote sense technology to eliminate voltage drops caused by cables connecting to the DUT. All settings and measurements appear on a large 4.3-inch color display.
Capture measurements over time with the built-in data logger
The EL30000 Series bench DC electronic loads can continuously log voltage, current, and energy to a data file. The sample rate is adjustable from 20 microseconds to 60 seconds. Store the data file on the internal non-volatile RAM or save externally on a USB memory device as a . CSV file.
Create, capture and display fast transients
Test the transient response of your power source with a dynamic load profile. The built-in scope feature digitizes the voltage and current and displays the results - just like an oscilloscope. The built-in scope function eliminates the need for external current shunts or current probes. This feature greatly reduces measurement setup complexity and provides accurate and fully specified measurements.