• Channels: 1
• Max Current Source/Measure Range: 120mA
• Max Voltage Source/Measure Range: 3000V
• Measurement Resolution (Current / Voltage): 1fA / 100nV
• Power: 180 W

The 2657A is a high voltage, high power, low current source measure unit (SMU) instrument that delivers unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. The 2657A is designed specifically for characterizing and testing high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials in which high voltage, fast response, and precise measurements of voltage and current are required. The 2657A offers the highest power and best low current performance in the industry. It is supported by the industry’s most powerful parametric characterization software platforms to grow with you as your applications evolve.

The 2657A offers highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It can be used as a:

• Semiconductor characterization instrument
• V or I waveform generator
• V or I pulse generator
• Precision power supply with V and I readback
• True current source
• Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
• Precision electronic load

Through TSP-Link Technology technology, the 2657A can be linked with Series 2600B SMU instruments to form a larger integrated system with up to 32 nodes. Precision timing and tight channel synchronization are guaranteed with built-in 500 ns trigger controllers. The fully isolated, independent channels of the SourceMeter SMU instruments make true SMU-per-pin testing possible.

The 2657A can be combined with Series 2600B and 4200-SCS SMU instruments to support multi-terminal test capability. The 2657A-PM-200 Protection Module and 2657A-LIM-3 Low Interconnect Module make it easier to connect multiple instruments to a probe station safely (not required for connecting to the 8010 High Power Device Test Fixture).

Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects, with the two measurement modes in the 2657A. Each mode is defined by its independent analog-to-digital (A/D) converters.

The digitizing measurement modem provides speeds up to 1 μs per sample. The dual 18-bit digitizers allow you to capture voltage and current transients simultaneously. In the integrating measurement mode, the dual 22-bit integrating analog to digital converters allow more precise measurement of voltage and current. Two A/D converters are used with each measurement mode, one for current and the other for voltage, that runs simultaneously for accurate source readback that does not sacrifice test throughput.

The dual high-speed A/D converters sample as fast as 1 μs per point, enabling full simultaneous characterization of both voltage and current.

The dual high speed A/D converters sample as fast as 1 μs per point, enabling full simultaneous characterization of both voltage and current.