• 100 MHz bandwidth
• 4 analog channels
• Maximum sample rate of 1 GSa/s
• Maximum memory depth of 14 Mpts
• Waveform capture rates up to 100,000 (normal mode) and 400,000 (sequence mode) waveforms per second

The 2194 combines performance and value all in one portable solution. This oscilloscope provides 100 MHz of bandwidth in a 4-channel configuration with a maximum sample rate of 1 GSa/s and a maximum memory depth of 14 Mpts. Equipped with a 7" LCD display and a waveform update rate of 100,000 waveforms per second, this device is able to capture infrequent glitches with excellent signal fidelity.

Increase productivity with free PC software for remote connectivity through LAN or USBTMC-compliant device ports. Access all the oscilloscopes functions without the need for programming and conveniently capture, save, and analyze measurement results.

Select from a variety of trigger modes including serial bus triggering with decoding support for I 2 C, SPI, UART, CAN and LIN protocols. In applications where signals are transmitted over long periods of time, segmented acquisition mode and history can extend waveform recording up to 80,000 segments.

Collect data using automatic measurements for 38 different parameters including statistical analysis. Display signals in the frequency domain using the FFT math operation with a maximum memory depth of 128 kpts. Rich in features for its class, the 2194 is the ideal solution for educational settings and hobbyists.

With update rates of 100,000 wfms/s, the 2194 captures infrequent glitches with excellent signal fidelity and reduces time spent debugging.

Capture longer time periods at higher resolution with a maximum memory depth of 14 Mpts. Enable zoom feature to display specific events in more detail.

Segmented acquisition partitions the memory into multiple segments (up to 80,000) of the signal when trigger conditions are met. Recall stored segments using the History function.

Serial bus decoding supports I2C, SPI, UART, CAN and LIN protocols. Information can be quickly displayed in a tabular format.

Generate a mask based on user-defined parameters to identify pass/fail test results. Useful in long-term signal monitoring or automated production line testing applications..

Displays signal in the frequency domain to ease measuring wave harmonics or discovering applications potential noise induced by frequency-dependent components.